je.st
news
Atomic Force Microscope is optimized for polymer research.
2015-10-02 14:31:05| Industrial Newsroom - All News for Today
Suited for polymer and material science applications, Cypher™ ES Polymer Edition comes with 3 nanomechanical characterization tools. These include 2 atomic force microscope (AFM) techniques – AM-FM and Contact Resonance Viscoelastic Mapping Modes – and Fast Force Mapping Mode. In addition to blueDrive™ photothermal excitation option, microscope supports environmental control via sample heater (250°C max) that integrates without extra cables, tubing, or controllers.
Tags: research
force
atomic
optimized
Category:Industrial Goods and Services