Home › Thermal Probe yields consistent Bake Cycle S Curve.
 

Keywords :   


Thermal Probe yields consistent Bake Cycle S Curve.

2014-05-13 14:30:47| Industrial Newsroom - All News for Today

Placed under bread or bun dough, Pan+Dough Probe simultaneously captures pan/dough interface temperature and dough core temperature. Readings are used to produce Bake Cycle S Curve indicating critical temperature points for yeast kill, gelatinization, and arrival time as they relate to percentage of travel through baking chamber. Since stationary vertical probe is always at fixed penetration depth, measurements are always at same reference point from one batch to next. This story is related to the following:Temperature Probes

Tags: consistent cycle thermal curve

Category:Industrial Goods and Services

Latest from this category

All news
18.06A Request From the A League of Their Own Womens Special Interest Group
18.06Next MANAchat Series is Scheduled for the Week of August 5
17.06New Federal Government Filing Requirement Regarding Ownership of LLCs and Corporations
17.06Manufacturers Reps That Sell to International Customers June 26 Networking Event
17.06Avoid $591 Daily Penalty From the U.S. Treasury Department
15.06With Gratitude for a Job Well Done
Industrial Goods and Services »
25.06Royal Mail buyer to make offer for all staff shares
25.06Hybrid Software wins FLAG Vendor Partner of the Year award
25.06Hospeco Purchases Nuance Solutions
25.06Atlantic Tropical Weather Outlook
25.06DNA Genetics opens new commercial sow research farm
25.06Eastern North Pacific Tropical Weather Outlook
25.06Briolf Group to Invest $30 Million in Its First US Production Plant
25.06IDENTCO rebrands TTL200 Series to DuraWrap and DuraFlag
More »