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Toshiba Nanoanalysis Corporation Expands Capabilities with ZEISS Xradia 520 Versa

2014-04-15 06:00:00| Industrial Newsroom - All News for Today

Thornwood, N.Y. &ndash; Carl Zeiss X-ray Microscopy, formerly Xradia, Inc., announced today that Kawasaki, Japan-based Toshiba Nanoanalysis Corporation has selected the recently-introduced ZEISS Xradia 520 Versa 3D X-ray microscope (XRM) to expand the capabilities of its busy analysis lab. Toshiba Nanoanalysis offers imaging services for complex analytical demands in semiconductor, biosciences and materials science research for industry and academia.<br /> <br /> According to Mr. Koichiro ...This story is related to the following:Optics and PhotonicsResearch Microscopes | Microscopes | Inspection Devices | Scientific Instruments | Industrial X-Ray Equipment

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