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HUBER+SUHNER Unveil Innovative New Range of High Speed Radio Frequency Test Components and VNA Test Leads at DesignCon 2016
2016-01-21 11:31:09| Industrial Newsroom - All News for Today
At DesignCon 2016 in Santa Clara, California, leading manufacturer of Global connectivity solutions, HUBER + SUHNER, will unveil innovative new additions to their radio frequency test assemblies and multicoax connector catalogues. The new VNA (vector network analyser) test lead series Sucotest 500V join the...
Anritsu Introduces ShockLine VNA Solutions To Lower Test Costs Associated With Verifying E-Band, Microwave Passive Component Performance
2015-12-04 05:16:40| rfglobalnet Home Page
Anritsu Company introduces an E-band option for its ShockLine MS46500B series of 2- and 4-port performance Vector Network Analyzers (VNAs) that addresses the market need to lower cost-of-test for E-band components. With the option installed, the MS46500B series can reduce production costs and more efficiently verify the performance of high-frequency passive components, such as antennas, filters, and duplexers, during manufacturing.
Tags: test
performance
lower
costs
Anritsu Introduces ShockLine VNA Solutions To Lower Test Costs Associated With Verifying E-Band, Microwave Passive Component Performance
2015-11-25 05:12:38| rfglobalnet Home Page
Anritsu Company introduces an E-band option for its ShockLine™ MS46500B series of 2- and 4-port performance Vector Network Analyzers (VNAs) that addresses the market need to lower cost-of-test for E-band components. With the option installed, the MS46500B series can reduce production costs and more efficiently verify the performance of high-frequency passive components, such as antennas, filters, and duplexers, during manufacturing.
Tags: test
performance
lower
costs
Anritsu Adds Dual Wavelength Measurement Capability To O/E Calibration Modules For VectorStar VNA Family
2015-11-23 07:31:38| wirelessdesignonline News Articles
Anritsu Company introduces two options for its MN4765B series of O/E calibration modules that help to create a highly accurate, flexible, and cost-effective solution for the characterization of optoelectronic devices such as modulators, photo receivers, and integrated optical transceiver modules.
Tags: family
modules
dual
measurement
VNA Test Cables mitigate phase change over 75,000 flexure cycles.
2015-11-04 14:31:05| Industrial Newsroom - All News for Today
Ruggedized VNA test cables withstand test lab use and production testing for 50 Ω communications systems. Male or female versions of SMA or Type-N connectors are available for cables operating to 18 GHz, 2.92 mm connectors are standard for cables operating to 26.5 GHz, and 2.4 mm connectors are standard for test cables performing up to 40 GHz. Torsion-resistant connector heads directly attached to stainless steel conduit style armoring enable up to 5,000 mating cycles.
Tags: change
test
phase
cables