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Tag: microscopes
Fiber Optic Illuminator brings sustainability to microscopes.
2016-01-29 14:31:06| Industrial Newsroom - All News for Today
Featuring 6 x 4.75 x 9 in. footprint, LuxPro LED Fiber Optic Light System is suitable for mounting and stacking in constrained areas. Illuminator is equipped with standard 0.625 in. light guide fitting and provides consistent cool white color temperature of 4,500 K. Operating from 96–264 Vac, LuxPro features linear light intensity control with continuous dimming, and advanced heat pipe technology that uses metal core PCBs. Unit accepts virtually any light guide with quick change adapters.
Tags: brings
fiber
sustainability
optic
ZEISS Highlights Range of Microscopes and Imaging Solutions at M&M 2015
2015-08-03 12:31:15| Industrial Newsroom - All News for Today
Visit Booth 638 to discover new insights to real world questions ZEISS announces it will be highlighting a wide range of precision microscopes, imaging solutions, and software at MM 2015, the Microscopy Microanalysis 2015 Meeting, which will be held August 2-6, 2015 at the Oregon Convention Center in Portland...
Tags: range
mm
solutions
highlights
Upright Microscopes are used for materials science and analysis.
2015-07-14 14:31:09| Industrial Newsroom - All News for Today
Respectively designed for manual and automated operation, Leica DM4 M and DM6 M can be used for imaging, measurement, and analysis of similar features across many samples and materials. Modules of Leica Application Suite benefit such applications as steel inclusion rating, particle analysis, and phase/grain analysis. Along with pushbutton-actuated Illumination and Contrast Manager, features include LED illumination, settings recall, and 1.25x Panorama objective.
Tags: science
analysis
materials
upright
Bruker Introduces Contour Elite 3D Optical Microscopes
2015-06-12 06:18:59| metrologyworld Home Page
Bruker Corporation recently announced the release of its new Contour Elite 3D Optical Microscopes, which for the first time fully integrate high-definition microscopy imaging with industry-leading three-dimensional (3D) optical metrology functionality
Tags: optical
elite
introduces
contour
ZEISS Highlights Scanning Electron Microscopes at EIPBN 2015
2015-05-27 12:31:13| Industrial Newsroom - All News for Today
Visit Booth 113 to learn about ZEISS GeminiSEM and ZEISS MultiSEM 505 technology ZEISS announces they will be highlighting a range of scanning electron microscope (SEM) technology at EIPBN, the 59th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication, May 26-29, 2015, at the...
Tags: highlights
electron
scanning
scanning electron