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PXI-based Test System accelerates LTE waveform creation.

2014-07-07 14:30:40| Industrial Newsroom - All News for Today

Providing tools to generate complex LTE/LTE-A multi-channel/MIMO waveforms and analyze multiple channels in frequency and modulation domains simultaneously, LTE/LTE-Advanced Multi-channel PXI-based Test Solution helps engineers gain deep insight into complex carrier aggregation and spatial multiplexing MIMO designs. Chassis backplane trigger tool configures and routes backplane triggers for proper time synchronization in MIMO configuration for up to 2 PXIe chassis. This story is related to the following:Communications Testers |

Tags: system test creation waveform

 

RF Conformance Test System: R&STS-ITS100: Brochure

2014-06-30 00:44:39| rfglobalnet Downloads

Rohde & Schwarz’s TS-ITS100 is an RF conformance test system that satisfies the regulatory test requirements associated with 802.11p user equipment, including C2C-CC basic system profile standards.

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RF Conformance Test System: R&STS-ITS100

2014-06-30 00:40:34| rfglobalnet Products

The TS-ITS100 conducts RF conformance tests for EU, USA, and Japan and offers complete coverage of industry performance tests in line with C2C-CC basic system profile standards. It’s fully automated for high efficiency and provides support for multiple antennas and filters for out-of-band testing.

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Rohde & Schwarz Presents The World's First RF Conformance Test System For Vehicle-To-Vehicle Applications In Line With IEEE 802.11p

2014-06-26 10:12:52| rfglobalnet Home Page

The new R&S TS-ITS100 for the automotive industry is the first fully automated test system for standard-compliant testing of RF components in line with IEEE 802.11p.

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Agilent Technologies' NFC Forum-Approved Test System For LLCP And SNEP Selected By AT4 wireless

2014-06-24 11:48:10| wirelessdesignonline News Articles

Agilent Technologies Inc. recently announced that AT4 wireless authorized test lab will use Agilent’s T3111S NFC Conformance Test System to test NFC Forum LLCP and SNEP protocols.

Tags: system test selected technologies

 

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