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Tag: light
World Renowned Research Center Selects TNSCs SR-4000HT MOCVD Reactor for Deep Ultra Violet Light Emitting Diode (UVCLED) Development
2016-03-18 11:31:10| Industrial Newsroom - All News for Today
Basking Ridge, NJ Matheson Tri-Gas, Inc., together with its parent company, Taiyo Nippon Sanso Corporation (TNSC), has announced that the Solid State Lighting Energy Electronics Center (SSLEEC), the world renowned research center at the University of California, Santa Barbara, installed an SR-4000HT grade gallium...
Tags: world
center
research
development
Permanent Mount Deck Light Allows Complete Rotation
2016-03-17 17:38:26| Chemical Processing
The 30 watt LED deck light features a 360 degree spindle.
Tags: complete
light
permanent
mount
Spectral Light and Color Meter simplifies measurement process.
2016-03-17 13:31:05| Industrial Newsroom - All News for Today
Used for conventional and LED light source qualification, MSC15 measures scotopic and photopic illuminance, S/P ratio, color (CRI and CCT with color perception), and PAR as well as Bilirubin and light spectra. Color touchscreen, along with dark current cancellation without zeroing cap, facilitates operation. Cosine corrected with f2 ≤3%, meter provides spatially accurate measurement in full light immersion applications. Software and USB interface are also standard.
Tags: process
light
color
meter
Remote Sensing Leaf Clip, Light Source enhance spectroradiometry.
2016-03-17 13:31:05| Industrial Newsroom - All News for Today
When used with PSR+ and RS-3500 field spectroradiometers, leaf clip and ILM-105 light source provide streamlined, effective approach to scanning vegetation. Leaf clip has spring grip handle, external pushbutton trigger, 3 mm spot size, and metal clad, field-swappable fiber optic cable. Along with built-in reflectance standard for reference scan, features include disposable white reference standard. ILM-105 light source is separated to keep heat away from sample.
Tags: source
light
remote
clip
In the Ramp Light in Las Vegas: JTAG Technologies Inside - The Future of Your ATE Application with Boundary-Scan
2016-03-16 11:31:10| Industrial Newsroom - All News for Today
IPC Apex 2016 Las Vegas, Booth 2413 Eindhoven, the Netherlands What test engineers worry about these days: the access to nodes of assemblies with ever increasing complexity is more and more difficult and results in reduced fault coverage. JTAG Technologies motto for Apex 2016 year reads: Optimise your ATE...
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