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Tag: aids
Quad-Channel Analyzer aids 3-phase power device design/testing.
2015-11-16 14:31:08| Industrial Newsroom - All News for Today
With touch-driven oscilloscope visualization, IntegraVision PA2203A provides 3-phase power measurements and analysis. Four-channel entry provides 0.05% basic accuracy and 16-bit resolution measurements needed to identify and characterize incremental improvements in electronic power conversion systems. Users can visualize transients, in-rush currents, and state changes with 5-M samples/sec digitizer that captures voltage, current, and power in real-time with 2.5 MHz bandwidth.
Tags: power
device
aids
analyzer
ASTM Test Method aids concrete surface texture quantification.
2015-11-13 14:31:07| Industrial Newsroom - All News for Today
Proposed ASTM International standard WK49335, Test Method for Concrete Micro Surface Texture, aims to minimize confusion in quantifying texture value (smoothness/roughness) at surface of concrete. Used to measure concrete surfaces with contact stylus instrument (profilometer), this standard will describe how to use profilometer and reliable data indexes for fast and precise surface inspection on diverse cement-based building materials.
Tags: test
method
surface
aids
Custom Rubber Manufacturing aids throwable camera development.
2015-11-11 14:31:06| Industrial Newsroom - All News for Today
Custom-designed outer skin supplies appropriate amount of bounce and energy absorption for Bounce Imaging's softball-sized, throwable, tactical camera ball, Explorer, which transmits 360° images to mobile device when tossed into such instances as hostage situations, burning buildings, or earthquake rubble. Design iterations varied regarding polymer type, hardness, heat resistance, modulus, and rebound properties. Camera increases safety for first responders and police personnel.
Tags: development
camera
custom
manufacturing
TEM Sample Preparation System aids failure analysis labs.
2015-11-05 14:31:06| Industrial Newsroom - All News for Today
Available in FX and HX models, Helios™ G4 DualBeam Series offers 7 nm TEM lamella preparation solution for semiconductor manufacturing and failure analysis applications. Flexible FX system delivers STEM resolution down to sub-three Ångströms and enables images to be obtained within minutes of completing lamella. HX model, geared specifically for high-throughput TEM lamella production, features automated QuickFlip holder that minimizes sample preparation times.
Tags: system
analysis
sample
failure
ON Semiconductor Announces New Solutions Enabling State-Of-The-Art Wireless And Recharging Features in Hearing Aids
2015-10-27 03:20:08| wirelessdesignonline News Articles
ON Semiconductor, driving energy efficient innovations, further underlines its leadership position in assisting next generation hearing aid development with the introduction of two new products: HPM10, a Power Management Integrated Circuit (PMIC), and Ezairo7150 SL, a wireless-enabled audio processor
Tags: features
solutions
wireless
aids
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