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3D Imaging System supports non-contact surface metrology.

2013-08-29 14:30:51| Industrial Newsroom - All News for Today

Suited for both production and scientific research markets, Nexview™ Profiler supports non-contact metrology of samples and surfaces ranging from very smooth to very rough. System provides sub-nanometer vertical resolution at all magnifications, and will safely measure fragile and transparent materials without altering test surface. Acting as interface for system control and data analysis, Mx™ software provides interactive 3D maps, quantitative topography information, and intuitive navigation. This story is related to the following:Test and Measuring InstrumentsMetrology Equipment | Imaging Systems

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