Shanghai Haier IC will use the tester in embedded Flash, RF microcontroller and digital probe testing for all of the products on its technology roadmap, most of which rely on embedded Flash memory for applications such as smart grid, smart home, the Internet of Things , industrial controls and consumer electronics. "We were looking for a universal platform that could efficiently test our full range of devices while achieving the lowest cost of test and reducing our time to market," said Wang Zhenyu, Operation Director of Shanghai Haier IC.