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Agilent Technologies' Waveform Generator/Fast Measurement Unit Used in NBTI Industry Defining ...

2014-06-05 06:00:00| Industrial Newsroom - All News for Today

Predictive NBTI Research Paper Presented by IIT at IEEE International Reliability Physics Symposium<br /> <br /> SANTA CLARA, Calif. &ndash; Agilent Technologies Inc. (NYSE: A) today announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC ...This story is related to the following:Electronic Components and Devices Sponsored by: Globtek Inc. - Your Power Partner...For Over 20 Years!Waveform Generators |

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