Predictive NBTI Research Paper Presented by IIT at IEEE International Reliability Physics Symposium<br />
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SANTA CLARA, Calif. – Agilent Technologies Inc. (NYSE: A) today announced that the Agilent B1530 Waveform Generator/Fast Measurement Unit (WGFMU) was used by the Indian Institute of Technology (IIT) Bombay to make ultrafast measurements of negative bias temperature instability (NBTI) degradation in deeply scaled high-K metal gate (HKMG) CMOS devices for a wide variety of DC ...This story is related to the following:Electronic Components and Devices Sponsored by: Globtek Inc. - Your Power Partner...For Over 20 Years!Waveform Generators |