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Anritsu Successfully Completes 4x4 MIMO Testing Of GCT Semiconductor LTE-Advanced Single Chip

2015-04-14 03:18:10| wirelessdesignonline News Articles

Anritsu announces it successfully completed testing of GCT Semiconductor’s 4G LTE-Advanced chip, GDM7243Q, using Anritsu’s MD8430A signaling tester with Rapid Test Designer (RTD).

Tags: single testing successfully chip

Category:Telecommunications

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