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CyberOptics to Present Award-Winning SPI and AOI Inspection Solutions at NEPCON China

2013-04-10 06:00:00| Industrial Newsroom - All News for Today

CyberOptics Corporation (Nasdaq: CYBE) will present its award-winning SPI and AOI inspection solutions in booth 1G55 at NEPCON China 2013, scheduled to take place April 23-25, 2013 at the Shanghai World EXPO Exhibition Convention Center.<br /> <br /> The QX600&trade; AOI System comes with an all-new Strobed Inspection Module (SIM) with enhanced illumination - delivering the best 01005 and solder joint inspection ever. A higher sensor resolution (12 µm) captures brilliant and crisp quality ...This story is related to the following:Automatic Optical Inspection Systems |

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