Home DARPA Virtual Lab Advances DOD's Ability To Test Critical Microelectronics
 

Keywords :   


DARPA Virtual Lab Advances DOD's Ability To Test Critical Microelectronics

2014-12-12 01:50:59| rfglobalnet Home Page

Under the auspices of DARPA’s Integrity and Reliability of Integrated Circuits program, researchers from the Naval Surface Warfare Center (NSWC) and Air Force Research Laboratory (AFRL) are collaborating in powerful new ways to determine the reliability and integrity of microchips embedded in the some of the nation’s most critical military weapon and cyber systems.

Tags: test ability critical virtual

Category:Telecommunications

Latest from this category

All news

»
29.06Eastern North Pacific Tropical Weather Outlook
29.06Atlantic Tropical Weather Outlook
29.06Tropical Storm Beryl Graphics
29.06Tropical Storm Beryl Forecast Discussion Number 2
29.06Tropical Storm Beryl Public Advisory Number 2
29.06Summary for Tropical Storm Beryl (AT2/AL022024)
29.06Tropical Storm Beryl Wind Speed Probabilities Number 2
29.06Tropical Storm Beryl Forecast Advisory Number 2
More »