je.st
news
DARPA Virtual Lab Advances DOD's Ability To Test Critical Microelectronics
2014-12-12 01:50:59| rfglobalnet Home Page
Under the auspices of DARPA’s Integrity and Reliability of Integrated Circuits program, researchers from the Naval Surface Warfare Center (NSWC) and Air Force Research Laboratory (AFRL) are collaborating in powerful new ways to determine the reliability and integrity of microchips embedded in the some of the nation’s most critical military weapon and cyber systems.
Tags: test
ability
critical
virtual
Category:Telecommunications
Latest from this category |
All news |
||||||||||||||||||||
|
|