Designed to directly measure absolute transmission and variable angle reflectance, UV Spectrophotometers are suited for analyzing doped crystalline materials, deep UV optics, and coatings. VUVAS models, available for long-life purged or vacuum operation, provide direct optical measurements from 120–350 nm. Some systems are available with both options, allowing users to select operational mode for application. For deeper UV measurements below 120 nm, windowless metrology systems are available.