With hardware module that contains various Boundary Scan structures as well as non-Boundary Scan components, Integra V1 is intended for demonstrating integration solutions with such test methods as functional test, in-circuit test, manufacturing defects analyzer, and flying probe test. Production faults can be simulated by switch, signal states can be monitored, and additional test points allow testing of non-scannable partitions. Concurrently, module can also qualify integration.