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Digital Image Analysis Software inspects IC components.

2013-07-11 14:30:11| Industrial Newsroom - All News for Today

Available on all Sonoscan equipment, Digital Image Analysis Toolbox™ automates acoustic analysis of individual IC components and various types of bonded wafers. Product sorts components automatically into accept/reject or multiple defined categories. It contains many pre-defined common analysis tools such as interface analysis, wafer bond analysis, and chip on wafer analysis. Because placement of component can be imperfect, DIA Toolbox provides search and locate function. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of: Imaging Software | Wafer Inspection Systems

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