Home Duke University Research Advances Testing Of 3D Integrated Circuits For Cost-Effective Development Of Smaller, Higher Performance Electronics
 

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Duke University Research Advances Testing Of 3D Integrated Circuits For Cost-Effective Development Of Smaller, Higher Performance Electronics

2015-04-15 03:25:00| wirelessdesignonline News Articles

Duke University researchers are working to advance the tools and methodologies used to test 3D integrated circuits (ICs), which promise to help ensure the ongoing development of higher performance, lower power semiconductor chips

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