Home › ED-XRF Spectrometer is optimized for sensitivity, detection.
 

Keywords :   


ED-XRF Spectrometer is optimized for sensitivity, detection.

2016-01-21 14:31:06| Industrial Newsroom - All News for Today

Leveraging energy dispersive X-ray fluorescence (ED-XRF) technology, SPECTRO XEPOS spectrometers handle multi-elemental analysis of major, minor, and trace element concentrations. Adaptive excitation as well as tube and detector technologies maximize sensitivity and minimize detection levels. To prevent on/off variations from affecting readings, X-ray tubes remain powered on between measurements. System's speed results in analysis of most samples within few minutes.

Tags: detection sensitivity optimized spectrometer

Category:Industrial Goods and Services

Latest from this category

All news
18.06A Request From the A League of Their Own Womens Special Interest Group
18.06Next MANAchat Series is Scheduled for the Week of August 5
17.06New Federal Government Filing Requirement Regarding Ownership of LLCs and Corporations
17.06Manufacturers Reps That Sell to International Customers June 26 Networking Event
17.06Avoid $591 Daily Penalty From the U.S. Treasury Department
Industrial Goods and Services »
29.06Tropical Storm Beryl Public Advisory Number 3A
29.06Summary for Tropical Storm Beryl (AT2/AL022024)
29.06Tropical Storm Beryl Graphics
29.06Eastern North Pacific Tropical Weather Outlook
29.06Atlantic Tropical Weather Outlook
29.06Weekly Recap: PPG, Hempel, Beckers Group Top This Weeks Stories
29.06Tropical Storm Beryl Graphics
29.06Tropical Storm Beryl Forecast Discussion Number 3
More »