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FIB SEM System investigates materials at nanometer scale.

2013-07-09 14:31:03| Industrial Newsroom - All News for Today

Combining high-resolution scanning electron microscope with focused ion beam milling, Helios NanoLab™ 660 DualBeam™ is used to investigate structure and function of materials at nanometer scale, create prototypes of micro and nano electro-mechanical systems, and prepare ultrathin samples for atomic scale imaging and analysis in TEM. NanoBuilder™ 2.0 nanoprototyping toolset automatically fabricates 3D prototypes of nano- and microscale devices from computer-generated models. This story is related to the following:Laboratory and Research Supplies and EquipmentSearch for suppliers of:

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