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FIB/SEM Systems facilitate imaging of challenging materials.

2013-07-23 14:29:58| Industrial Newsroom - All News for Today

DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited for investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning engine, MultiChem™ gas delivery system, and Tomahawk™ ion optics, provides capabilities for fabricating prototypes of complex nanodevices. This story is related to the following:Vision SystemsSearch for suppliers of: Electron Microscopes |

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