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Field pattern variances: Yield impacts

2013-11-04 19:11:00| Corn & Soybean Digest

LimelightPlayerUtil.initEmbed("limelight_player_803768"); Bob Recker, Cedar Valley Innovation, takes aerial images of fields and looks down to the plant level to determine the cause of field patterns and variances. This is his 9th year of foucs at the plant level. "It's been an evolving process," Recker says. read more

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