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Home › Film Thickness Measuring Software covers sub-micron sampling.

 

Film Thickness Measuring Software covers sub-micron sampling.

2014-03-10 13:30:41| Industrial Newsroom - All News for Today

Used with CRAIC Technology microspectrometers and their controlling Lambdafire&trade; software, CRAIC FilmPro&trade; lets users measure thickness of thin films of microspot areas in both reflectance and transmission in accelerated and non-destructive manner. Capabilities enable analysis of films of various materials on both transparent and opaque substrates. Areas of use range from research to industrial settings. Sampling areas can range from over 100 microns to <1 micron. This story is related to the following:Measuring Software |

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