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Flaw Detector supports range of applications.

2013-10-03 14:30:25| Industrial Newsroom - All News for Today

To meet range of application requirements, OmniScan MX supports conventional eddy current testing (ECT), eddy current array (ECA), and bond testing (BT) C-scan technology via 2 module versions. Both modules are compatible with MXE (ECT/ECA) and MXB (BT C-scan) software, facilitating transition between technologies. In ECA mode, flaw detector can perform inspections through thin coatings on conductive material. C-scan BT technology is suited for honeycomb composite inspections. This story is related to the following:Flaw Detectors

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