Systems Offer Comprehensive Defect Information for Solving Yield Challenges<br />
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SAN FRANCISCO -- Today at SEMICON West, KLA-Tencor Corporation (NASDAQ: KLAC) announced four new systems--the 2920 Series, Puma(TM) 9850, Surfscan® SP5 and eDR(TM)-7110--that provide advanced defect inspection and review capability for the development and production of 16nm and below IC devices. The 2920 Series broadband plasma patterned wafer, Puma 9850 laser scanning patterned wafer, and Surfscan SP5 ...This story is related to the following:Test and Measuring Instruments Sponsored by: Red Lion Controls - UntitledSearch for suppliers of: Inspection Devices |