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KLA-Tencor P-11 Long Scan Surface Profiler: Features

2017-06-19 12:04:10| Wafer Inspection Systems refurbished, NIST Calibration Standards, semiconductor parts, robots and lasers

Computerized, highly sensitive Surface Profiler that measures roughness, waviness, step height, and other surface characteristics in a variety of applications.

Tags: long features surface scan

Category:Electronics and Electrical

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