Home Keysight Technologies Announces Support For High-Volume Manufacturing Of Femtocell Designs Based On Broadcom's BCM617xx Chipsets With The EXF Wireless Test Set
 

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Keysight Technologies Announces Support For High-Volume Manufacturing Of Femtocell Designs Based On Broadcom's BCM617xx Chipsets With The EXF Wireless Test Set

2015-02-24 06:52:03| wirelessdesignonline News Articles

Keysight Technologies, Inc. recently announced that its E6650A EXF wireless test set for femtocell now supports high-volume manufacturing test for designs using Broadcom Corporation’s BCM617xx Series small cell chipsets. The EXF one-box tester delivers the speed, performance and scalability today’s manufacturers need to quickly ramp up production and lower its cost-of-test.

Tags: set support based test

Category:Telecommunications

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