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Metrology System offers non-destructive, 3D surface profiling.
2014-02-20 14:31:07| Industrial Newsroom - All News for Today
Combining lateral resolution up to 140 nm via confocal microscopy and vertical resolution up to 0.1 nm with interferometry, Leica DCM8 provides surface analysis of materials and components. Instrument is also suitable for color documentation of samples. Wide choice of Leica objectives, together with 4 LED light sources and integrated CCD camera, deliver true-to-life color images. With XY topography-stitching mode, users can obtain seamless, precise model of larger area. This story is related to the following:Machinery and Machining Tools Sponsored by: Haas Automation, Inc. - Category SponsorLaboratory and Research Supplies and EquipmentSurface Profilers | Confocal Microscopes | Profiling Machinery | Metrology Instruments |
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