Home › Microscopy technique could help computer industry develop 3-D components
 

Keywords :   


Microscopy technique could help computer industry develop 3-D components

2013-06-29 17:03:59| Semiconductors - Topix.net

The technique, called Through-Focus Scanning Optical Microscopy , has now been shown able to detect tiny differences in the three-dimensional shapes of circuit components, which until very recently have been essentially two-dimensional objects.

Tags: computer industry develop components

Category:Electronics and Electrical

Latest from this category

All news
»
26.06PPG to Announce Second-quarter 2024 Results July 18
26.06Fresh Coat for First Responders: New Hampshire Fire Station Gets a Makeover by California Paints
26.06Michigan Sets Record Recycling Rate in 2023, Recycles Nearly 70,000 Tons of Materials
26.06Companies Seek Federal EPR: How Producers Can Prepare
26.06Q&A with GFLs Tyler Stefure: Integrating New Fleet Tech & Upholding GFL Values
26.06SWANA Publishes Report on the Performance of Seattles Zero Waste System
26.06Baltimore Sues Major Brands for Alleged Role in Plastic Pollution Crisis
26.06Petco Aims Sight at Large-Scale Recycling Program to Divert LDPE Plastic from Landfills
More »