With total of 96 single ended channels, Model SFX-5296LX extends Boundary Scan test to non-scannable components such as connectors, clusters, or analog interfaces. Unit uses parallel I/O and is equipped with diverse dynamic test resources for each channel, such as frequency counter, event detector, arbitrary waveform generator, and digitizer. Each channel can be configured as input, output, and tri-state, and both static and dynamic at-speed tests are feasible.