August 5th, 2015 -- The New Moortec Embedded Process Detector circuit provides the means for advanced node Integrated Circuit developers to detect the process variations brought about by manufacturing variability and drift of advanced node core digital MOS devices. The Process Detector can be used to enable a continuous Dynamic Voltage & Frequency Scaling optimisation system, monitor manufacturing variations on and if required, across chip, gate delay measurements, critical path analysis, critical voltage analysis and also monitor silicon 'ageing'.