Home › More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool For 14nm & 10nm Process Development And Ramp-Up
 

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More Leading Semiconductor Players Selecting Jordan Valley's JVX7300LMI Metrology Tool For 14nm & 10nm Process Development And Ramp-Up

2013-10-04 06:01:42| metrologyworld Home Page

Jordan Valley SemiconductorsLtd., a leading supplier of X-ray based metrology tools for advanced semiconductor manufacturing lines, today announced that it has received another order for its recently introduced JVX7300LMI scanning X-ray in-line metrology tool for patterned and blanket wafers

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