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NIR DLP Device and Evaluation Module help advance spectroscopy.

2014-03-10 13:30:42| Industrial Newsroom - All News for Today

Together, DLP4500NIR single element detector and DLP NIRscan™ EVM (evaluation module) bring MEMS technology into transmittance and reflective spectroscopy. Featuring ~1 million digitally programmable micromirrors, DLP4500NIR lets engineers replace linear detector arrays to create spectrometer designs. Optimized for use with 700–2,500 nm light, product can be programmed to select and attenuate multiple wavelengths at speeds up to 4 kHz. DLP® technology architecture also enables SNRs >30,000:1. This story is related to the following:Test and Measuring InstrumentsSearch for suppliers of:

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