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NOVA Receives First Order for In-Situ Real-Time Profile Measurement...

2015-02-17 14:51:32| Semiconductors - Topix.net

Nova Measuring Instruments , a leading innovator and key provider of optical metrology solutions for advanced process control used in semiconductor manufacturing, announced today that it has received its first order for Real-time Profile Measurement solution, NovaRPMA , for real-time monitoring of advanced Etch processes. The solution, which will be delivered to a major memory manufacturer, is a result of a close cooperation between Nova, a leading wafer fabrication equipment supplier and this memory customer.

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Category:Electronics and Electrical

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