je.st
news
New Tool For 3D FinFETs To 10 nm And Beyond
2015-03-12 07:34:01| metrologyworld Home Page
Carbon Design Innovations, Inc. has created probes for atomic force microscopes that represent the ‘next generation’ in imaging technology
Tags: and
tool
beyond
nm
Category:Industrial Goods and Services
Latest from this category |
All news |
||||||||||||||||||||
|
|
||||||||||||||||||||