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Noise Analyzer measures flicker noise and RTN.

2014-03-21 13:30:56| Industrial Newsroom - All News for Today

Featuring modular design that minimizes system noise, E4727A Advanced Low-Frequency Noise Analyzer supports wafer mapping measurement and data analysis of flicker noise and random telegraph noise. Typical applications include development, qualification, and monitoring of semiconductor materials and IC manufacturing processes. Analyzer is also suitable for design and verification of many circuits used as fundamental building blocks in RF, analog, and high-speed digital applications. This story is related to the following:Noise Analyzers

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