Nondestructive D9600Z C-SAM® system facilitates IGBT (Insulated Gate Bipolar Transistor) power module imaging. WaterPlume™ transducer scans through heat sink from bottom of module. Ultrasound pulsed into heat sink will also image ceramic plates (rafts) above heat sink as well as die attachments near top of module. Along with option for 2 transducers that operate simultaneously to accelerate imaging, features include stage with various plates for IGBTs and fully automated operation.
This story is related to the following:Non-Destructive Testers (NDT)