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Parametric Test System accelerates throughput via software.

2015-09-30 14:31:07| Industrial Newsroom - All News for Today

Available in 200 V and 1 kV versions, Keithley S530 features Keithley Test Environment (KTE) v5.6 system software that reduces measurement speed to increase wafer-level test throughput for semiconductor production and R&D departments. Software features reduce settling time associated with low current measurements, while system measurement settings and streamlined software execution further improve system speed. Also included, Keithley DMM accelerates low voltage and low resistance measurements.

Tags: system software test throughput

Category:Industrial Goods and Services

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