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Park Systems Introduces Park NX20 Atomic Force Microscope, The Leading AFM Nano Metrology Tool For Device Failure Analysis

2013-05-10 08:30:19| metrologyworld News Articles

Park Systems, world leader in atomic force microscopy (AFM) for the semiconductor and hard disk markets introduces Park NX20, an enhanced design of the already successful XE series that assures the highest level of precision for roughness measurement and defect review

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