ATP Power Cycling Test validates design of ATP PowerProtector, available in flash products, by demonstrating functionality under sudden power-down situations. At beginning of each cycle, test writes segment of data pattern into testing device and waits for exact microsecond to cut off power during programing data into NAND blocks. During power cycles, product without PowerProtector will result in data corruption and show Fail, whereas product with ATP PowerProtector will show Pass.
This story is related to the following:Trouble Shooting Software