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Rigaku Announces The NANOHUNTER II Benchtop Total Reflection X-ray Fluorescence (TXRF) Spectrometer

2015-09-11 06:36:17| metrologyworld Home Page

X-ray scientific, analytical and industrial instrumentation manufacturerRigaku Corporation, (3-9-12, Matsubara-cho, Akishima-shi, Tokyo 196-8666, JAPAN Tel: 042-545-8111; President: Hikaru Shimura) has announced the next generationRigaku NANOHUNTER IIbenchtop total reflection X-ray fluorescence (TXRF) spectrometer that enables high-sensitivity ultra-trace elemental analysis, in liquids or on solid surfaces, to the parts-per-billion (ppb) level

Tags: total reflection announces fluorescence

Category:Industrial Goods and Services

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