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Home › Rudolph Adds NSX 220 System to Macro Defect Inspection Family

 

Rudolph Adds NSX 220 System to Macro Defect Inspection Family

2013-09-04 02:36:07| Semiconductors - Topix.net

The new NSX tool is designed for semiconductor, MEMS and LED packaging and test facilities to achieve productivity at a low price point )--Rudolph Technologies, Inc. today announced the availability of its new NSXA 220 Automated Macro Defect Inspection System .

Tags: system family inspection adds

Category:Electronics and Electrical

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