je.st
news
Rudolph Adds NSX 220 System to Macro Defect Inspection Family
2013-09-04 02:36:07| Semiconductors - Topix.net
The new NSX tool is designed for semiconductor, MEMS and LED packaging and test facilities to achieve productivity at a low price point )--Rudolph Technologies, Inc. today announced the availability of its new NSXA 220 Automated Macro Defect Inspection System .
Tags: system
family
inspection
adds
Category:Electronics and Electrical
Latest from this category |
All news |
||||||||||||||||||||
|
|
||||||||||||||||||||