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Rudolph Gains Traction in Mobile Device Market with Multi-System...

2014-11-17 14:47:59| Semiconductors - Topix.net

Rudolph Technologies, Inc. announced today that it has received multi-system orders from several customers for its latest MetaPULSEA G metal metrology system in support of their mobile device components ramp. The MetaPULSE systems will provide critical process control metrology enabling the manufacture of advanced multi-band and multi-mode frequency components used in the latest generation of smartphones and mobile devices.

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