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Rudolph's NSX Macro Defect Inspection System Selected by Merit Sensor Systems

2013-04-10 06:00:00| Industrial Newsroom - All News for Today

The automated inspection system will assure quality of pressure sensors used in critical applications.<br /> <br /> Flanders, New Jersey -- Rudolph Technologies, Inc. (NASDAQ: RTEC), a leading provider of process characterization equipment and software for the semiconductor and related industries,announced today that it has sold an NSX®Series macro defect inspection system to Merit Sensor Systems, Inc., a wholly-owned subsidiary of Merit Medical Systems, Inc. (NASDAQ: MMSI), a leading ...This story is related to the following:Surface Defect Detection Systems | Wafer Inspection Systems

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