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Sample Holder for In Situ TEM can heat samples to over 1000°C.
2014-05-21 14:30:39| Industrial Newsroom - All News for Today
Suited for scientists studying structure-function relationship of materials, NanoEx™-i/v sample holder can be integrated with FEI transmission electron microscopes (TEMs) to observe effects of heating and electrical bias on nanostructured materials during in situ experiments. Holder is optimized to accept various sample geometries, from nanoparticles to thin FIB-prepared lamellae, and includes MEMS-based heating element as well as contacts for applying electrical bias. This story is related to the following:Chemical Processing and Waste ManagementSearch for suppliers of: Sample Preparation Equipment | Microscope Accessories
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