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Teledyne LeCroy Demonstrates Latest Test Technology for Embedded Systems Development at EE ...
Teledyne LeCroy Demonstrates Latest Test Technology for Embedded Systems Development at EE ...
2014-04-01 06:00:00| Industrial Newsroom - All News for Today
CHESTNUT RIDGE, N.Y. and SAN JOSE, Calif. — Increasingly complex embedded systems, using higher-speed serial data busses, make signal integrity issues and higher-bandwidth oscilloscopes newly relevant to the embedded market. The Teledyne LeCroy oscilloscopes, protocol analyzers, logic analyzers, waveform generators, and test solutions showcased at the EE Live 2014 exhibition in San Jose provide the performance and feature sets necessary for complex embedded system development. EE Live ...This story is related to the following:SoftwareOscilloscopes | Logic Analyzers |
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