Available in the Plug-In/2FF format, 64K/J LTE Test (U)SIM – M2M UICC examines behavior of mobile devices, such as mobile phones, at temperatures from -40 to +105° to help confirm proper functioning in extreme temperature zones. Supporting 1.8, 3, and 5 V voltage classes, test card meets ETSI specification TS 102 671, includes LTE data fields, and carries GSM and USIM application.
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