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Test Card evaluates device behavior in extreme temperatures.
2013-05-28 14:29:41| Industrial Newsroom - All News for Today
Available in the Plug-In/2FF format, 64K/J LTE Test (U)SIM – M2M UICC examines behavior of mobile devices, such as mobile phones, at temperatures from -40 to +105° to help confirm proper functioning in extreme temperature zones. Supporting 1.8, 3, and 5 V voltage classes, test card meets ETSI specification TS 102 671, includes LTE data fields, and carries GSM and USIM application. This story is related to the following:Data Communication Testers | Test Systems |
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Category:Industrial Goods and Services
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