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Testing DDR3 Memory with Boundary Scan / JTAG Explored in New eBook by ASSET InterTech

2013-08-06 06:00:00| Industrial Newsroom - All News for Today

Richardson, TX  &ndash; ASSET® InterTech (<a href="http://www.asset-intertech.com">www.asset-intertech.com</a>), the leading supplier of tools for embedded instrumentation, has issued a new eBook on how to test DDR memory with non-intrusive JTAG or boundary-scan (IEEE 1149.1) methods. A recent survey of engineers by the International Electronics Manufacturing Initiative (iNEMI) found that testing memory soldered to circuit boards is a major problem for system manufacturers.<br /> <br ...

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