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ZEISS Industrial Metrology will Spotlight Several New Measurement Technologies at IMTS 2014

2014-08-21 06:00:00| Industrial Newsroom - All News for Today

MAPLE GROVE, Minn. &ndash; ZEISS Industrial Metrology has announced it will feature several new products at IMTS 2014 (International Manufacturing Technology Show) that enhance customer productivity, increase accuracy and reduce energy consumption.<br /> <br /> The new ZEISS CONTURA coordinate measuring machines with navigator technology for active sensors allow faster scanning of circular features while also increasing accuracy. navigator will automatically calculate the optimal scanning ...This story is related to the following:SoftwareMeasuring Machinery | Simulation Software | Measurement & Inspection Sensors | Business Intelligence Software |

Tags: industrial technologies measurement spotlight

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