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ALMA's Thorburn And Microsoft's Tennenhouse To Present IMS2013 Closing Ceremonies On Wireless Technology And Impact On Innovation
2013-04-16 11:00:00| rfglobalnet News Articles
ALMA’s Department of Engineering Head and joint ALMA Observatory Project Manager, Michael Thorburn and Dr. David Tennenhouse, Corporate Vice President of Technology Policy for Microsoft, will present closing ceremony keynotes on Thursday, June 6 at the 2013 IEEE MTT-S International Microwave Symposium (IMS) in Seattle.
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ALMA's Thorburn And Microsoft's Tennenhouse To Present IMS2013 Closing Ceremonies On Wireless Technology And Impact On Innovation
2013-04-16 11:00:00| wirelessdesignonline News Articles
ALMA’s Department of Engineering Head and joint ALMA Observatory Project Manager, Michael Thorburn and Dr. David Tennenhouse, Corporate Vice President of Technology Policy for Microsoft, will present closing ceremony keynotes on Thursday, June 6 at the 2013 IEEE MTT-S International Microwave Symposium (IMS) in Seattle.
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technology
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impact
Ticona to Present Technical Papers at SPE ANTEC 2013
2013-04-16 06:00:00| Industrial Newsroom - All News for Today
Ticona, the engineering polymers business of Celanese Corporation, is presenting 10 technical papers and one poster on material innovations during the Society of Plastics Engineers (SPE) Annual Technical Conference (ANTEC 2013) Sunday to Wednesday, April 21 to 24, at the Duke Energy Convention Center in Cincinnati.<br /> <br /> Ticona, also an exhibitor at Booth #205, will deliver the papers during the Technical Sessions:<br /> <br /> M5 Electrical and Electronics (Monday, April 22, in Room ...
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technical
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spe
CyberOptics to Present Award-Winning SPI and AOI Inspection Solutions at NEPCON China
2013-04-10 06:00:00| Industrial Newsroom - All News for Today
CyberOptics Corporation (Nasdaq: CYBE) will present its award-winning SPI and AOI inspection solutions in booth 1G55 at NEPCON China 2013, scheduled to take place April 23-25, 2013 at the Shanghai World EXPO Exhibition Convention Center.<br /> <br /> The QX600™ AOI System comes with an all-new Strobed Inspection Module (SIM) with enhanced illumination - delivering the best 01005 and solder joint inspection ever. A higher sensor resolution (12 µm) captures brilliant and crisp quality ...This story is related to the following:Automatic Optical Inspection Systems |
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china
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inspection
Indium Corporation Technology Experts to Present at SMTA Technical Conference
2013-04-09 06:00:00| Industrial Newsroom - All News for Today
<a href="http://Indium Corporation">Indium Corporation</a>’s <a href="http://Tim Jensen">Tim Jensen</a>, Product Manager – PCB assembly materials; <a href="http://Dr. Yan Liu">Dr. Yan Liu</a>, Research Chemist; and <a href="http://Sehar Samiappan">Sehar Samiappan</a>, Area Technical Manager for North Malaysia, the Philippines, and Vietnam, will present at the <a href="http://South East Asia Technical Conference on Electronics Assembly Technologies">South East Asia Technical ...
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